OVMS3-idf/components/driver/test/esp32
2019-12-03 22:58:42 +08:00
..
test_adc2.c examples: modify other examples and tests to use esp_netif instead of tcpip_adapter 2019-11-13 12:36:25 +01:00
test_gpio.c bugfix(gpio):fix esp32 s2 rtc io issue 2019-11-27 17:18:20 +08:00
test_i2c.c bugfic(i2c): fix i2c driver ut issue. 2019-11-25 07:03:02 +00:00
test_i2s.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
test_pcnt.c fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
test_pwm.c mcpwm: add HAL layer support 2019-11-25 00:36:30 +08:00
test_rmt.c rmt: add HAL layer 2019-11-20 10:54:21 +08:00
test_rs485.c ci: disable UTs for esp32s2beta without runners 2019-09-04 10:53:25 +10:00
test_sdio.c sdio: add unit test between host and slave 2019-12-03 22:58:42 +08:00
test_spi_master.c Merge branch 'master' into feature/esp32s2beta_merge 2019-10-15 14:59:27 +11:00
test_spi_param.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
test_spi_sio.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
test_spi_slave.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00