1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
There used to be dummy phase before out phase in common command
transactions. This corrupts the data.
The code before never actually operate (clear) the QE bit, once it finds
the QE bit is set. It's hard to check whether the QE set/disable
functions work well.
This commit:
1. Cancel the dummy phase
2. Set and clear the QE bit according to chip settings, allowing tests
for QE bits. However for some chips (Winbond for example), it's not
forced to clear the QE bit if not able to.
3. Also refactor to allow chip_generic and other chips to share the same
code to read and write qe bit; let common command and read command share
configure_host_io_mode.
4. Rename read mode to io mode since maybe we will write data with quad
mode one day.
Add support for get write protection support, fixed the duplicated
set_write_protection link.
All the write_protection check in the top layer are removed. The lower
levels (chip) should ensure to disable write protection before the
operation start.
Using xxx_periph.h in whole IDF instead of xxx_reg.h, xxx_struct.h, xxx_channel.h ... .
Cleaned up header files from unnecessary headers (releated to soc/... headers).
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
New unity component can be used for testing other applications.
Upstream version of Unity is included as a submodule.
Utilities specific to ESP-IDF unit tests (partitions, leak checking
setup/teardown functions, etc) are kept only in unit-test-app.
Kconfig options are added to allow disabling certain Unity features.
The fix is for the situation when cache disabling mechanism causes
a deadlock with user tasks. Situation is as follows:
1. spi_flash operation is started from low-priority task on CPU0
2. It uses IPC to wake up high-priority IPC1 task on CPU1, preventing
all other tasks on CPU1 from running. This is needed to safely
disable the cache.
3. While the task which started spi_flash operation is waiting for IPC1
task to acknowledge that CPU1 is not using cache anymore, it is
preempted by a higher priority application task ("app0").
4. Task app0 busy-waits for some operation on CPU1 to complete. But
since application tasks are blocked out by IPC1 task, this never
happens. Since app0 is busy-waiting, the task doing spi flash
operation never runs.
The more or less logical soltion to the problem would be to also do
cache disabling on CPU0 and the SPI flash operation itself from IPC0
task. However IPC0 task stack would need to be increased to allow doing
SPI flash operation (and IPC1 stack as well). This would waste some
memory. An alternative approach adopted in this fix is to call FreeRTOS
functions to temporary increase the priority of SPI flash operation task
to the same level as the IPC task.
Fixes https://github.com/espressif/arduino-esp32/issues/740
Fixes https://github.com/espressif/esp-idf/issues/1157
* Writing >4 bytes to unaligned offsets would fail
* Writiing data from flash would fail (wrong buffer was used)
* Writing >8192 bytes from RAM would over-write data multiple times
Adds test cases for the above.
1) fixed SPI_read_status: added check for flash busy flag in matrix mode
2) fixed SPI_page_program: enable write before writing data to SPI FIFO
3) SPI flash ROM funcs replacement is controlled via menuconfig option
