Commit graph

413 commits

Author SHA1 Message Date
Wang Jia Lin f5e60524ac Merge branch 'bugfix/fix_i2c_driver_breakingchange_issue' into 'master'
bugfix(i2c): fix I2C driver breaking change issue

See merge request espressif/esp-idf!6809
2019-12-06 16:50:16 +08:00
houwenxiang aac935ec81 bugfix(i2c): fix I2C driver breaking change issue.
1. Fixed I2C driver breaking change issue.
    2. Add I2C UT test case.
2019-12-04 15:51:36 +08:00
houwenxiang e4230d11ca bugfix(UART): fix uart driver spinlock misused bug
1. fix uart driver spinlock misused bug
    2. add uart driver ut test case
    3. undo the change in light_sleep_example_main.c
2019-12-03 16:06:31 +08:00
Wang Jia Lin 1ffcb54444 Merge branch 'bugfix/fix_esp32-s2_rtc_io_issue' into 'master'
bugfix(gpio): fix esp32 s2 rtc io issue and gpio testcase issues

See merge request espressif/esp-idf!6832
2019-12-03 11:17:41 +08:00
Renz Christian Bagaporo e6ad330018 ble_mesh_wifi_coexist example: Disable Wi-Fi RX IRAM optimisation
Otherwise IRAM usage is too high in this example.
2019-11-28 09:20:00 +08:00
Fu Zhi Bo 3a468a1ffd Refactor the touch sensor driver 2019-11-27 20:08:44 +08:00
xiongyu af4c455417 bugfix(gpio):fix esp32 s2 rtc io issue
* Modify the function implementation of ESP32-S2 RTC GPIO
  On ESP32 those PADs which have RTC functions must set pullup/down/capability via RTC register.
  On ESP32-S2, Digital IOs have their own registers to control pullup/down/capability, independent with RTC registers.
* Add ESP32-S2 support of unit test
* Modify the pull-up test of unit test
* Modify the interrupt test of unit test
* Modify input and output mode test of unit test
2019-11-27 17:18:20 +08:00
Angus Gratton 91b7a7beaf Merge branch 'bugfix/timer_intr_status_get' into 'master'
bugfix(timer): fix get intr status function

See merge request espressif/esp-idf!6807
2019-11-27 09:13:16 +08:00
Angus Gratton 64c8b640a1 Merge branch 'feature/log_component_noos' into 'master'
log: make compatible with non-OS builds

See merge request espressif/esp-idf!6787
2019-11-27 08:34:22 +08:00
chenjianqiang bcfe684951 bugfix(timer): add a macro to control making the XTAL related functions 2019-11-26 12:39:46 +00:00
chenjianqiang 856d9f7d89 bugfix(timer): recover get raw interrupt status function 2019-11-26 12:39:46 +00:00
houwenxiang f27ae9b0e2 feature: Add uart hal support. 2019-11-26 20:01:50 +08:00
kooho f0f20e0496 bugfix(i2c): fix esp32-s2 i2c driver UT issue 2019-11-26 12:01:18 +08:00
Angus Gratton f2a1a6105a Merge branch 'feat/mcpwm_hal'
Manual merge of !6626
2019-11-25 17:18:48 +11:00
Angus Gratton 6dd36fd571 Merge branch 'refactor/hal_gpio_driver'
Manual merge of !5597
2019-11-25 10:49:40 +11:00
Angus Gratton f34edba8f3 Merge branch 'feature/adc_driver_hal_support'
Manual merge of !6044
2019-11-25 10:22:06 +11:00
michael 538540ce21 mcpwm: add HAL layer support
Also improved the unit tests a bit.
2019-11-25 00:36:30 +08:00
xiongyu a3b79e9202 refactor(gpio): add hal gpio driver 2019-11-22 17:24:53 +08:00
fuzhibo f49b192a5e refactor the adc driver 2019-11-22 15:42:16 +08:00
Mahavir Jain 25c0752682 i2s: fix regression in retrieval of chip revision causing apll test to fail 2019-11-22 11:46:38 +05:30
Wang Jia Lin a8d3e3ab4a Merge branch 'feature/dac_driver_hal_support' into 'master'
dac: add hal for dac driver

See merge request espressif/esp-idf!5591
2019-11-22 13:59:32 +08:00
fuzhibo 03ac1aaafd dac: refactor driver add hal 2019-11-22 11:44:46 +08:00
Angus Gratton 0e0994092e Merge branch 'feature/esp32s2beta_fix_rtc_peripheral_driver' into 'master'
Driver: fix touch driver and deep sleep example

See merge request espressif/esp-idf!6476
2019-11-22 11:39:41 +08:00
Ivan Grokhotkov 951ed739f7 soc/cpu: add non-xtensa-specific replacement of xthal_get_ccount 2019-11-21 19:22:35 +01:00
houwenxiang 28286183d1 feature(I2C): Add i2c hal support. 2019-11-21 20:34:07 +08:00
fuzhibo 246242dbd5 driver: fix sens_struct.h;
driver: fix timer wakeup dsleep;
example: fix EXT1 wakeup dsleep;
example: fix touch pad wakeup dsleep;
2019-11-21 20:31:34 +08:00
chenjianqiang 857dec108d feat(ledc): refactor ledc driver
1. add hal and low-level layer for ledc driver
2. support esp32s2beta ledc
2019-11-21 16:25:22 +08:00
chenjianqiang 9f9da9ec96 feat(timer): refator timer group driver
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
2019-11-21 14:14:19 +08:00
xiongyu e62b831867 refactor(sigmadelta): add hal sigmadelta driver 2019-11-21 11:53:07 +08:00
fuzhibo 0c2bf7c8bc rtcio: add hal for driver 2019-11-21 10:40:49 +08:00
Angus Gratton b30b0e59fa Merge branch 'feature/add_rmt_hal' into 'master'
rmt: add hal layer and new examples

Closes IDF-841, IDF-844, and IDF-857

See merge request espressif/esp-idf!5649
2019-11-21 09:53:54 +08:00
Angus Gratton 95b9b41258 Merge branch 'bugfix/ethernet_add_reference_counter' into 'master'
ethernet: add reference counter for mac and phy && add gpio config outof Kconfig

Closes IDF-1056

See merge request espressif/esp-idf!6682
2019-11-21 06:58:13 +08:00
Wang Jia Lin f9d5b67b81 Merge branch 'refactor/hal_i2s_driver' into 'master'
refactor(i2s): add hal i2s driver

Closes IDFGH-2097

See merge request espressif/esp-idf!5601
2019-11-20 17:45:21 +08:00
morris 8fd8695ea1 rmt: add HAL layer 2019-11-20 10:54:21 +08:00
suda-morris 05d71319de ethernet: add gpio number into config structure 2019-11-20 10:36:45 +08:00
Anton Maklakov bd49b3f315 Merge branch 'bugfix/soc_missing_tests' into 'master'
soc: fix unit tests not included in the build

See merge request espressif/esp-idf!6723
2019-11-20 00:32:43 +08:00
xiongyu 8c76a3c10d refactor(i2s): add hal i2s driver 2019-11-19 22:19:19 +08:00
Anton Maklakov f04e45b340 soc: remove invalid esp32s2beta tests
Need to update them later, ref: IDF-1169
2019-11-18 16:05:37 +07:00
Anton Maklakov 7b0be33a7a soc: fix unit tests not included in the build
Regression from 9eccd7c082
2019-11-18 15:58:49 +07:00
xiongyu b1a72866ca refactor(pcnt): add hal pcnt driver 2019-11-18 14:35:46 +08:00
KonstantinKondrashov e3ff160733 soc/esp32: Add test_env for 32kHz XTAL unit tests 2019-10-31 13:23:47 +08:00
KonstantinKondrashov f9e0e3557f soc/esp32s2beta: Add test_env for 32kHz XTAL unit tests 2019-10-31 13:23:47 +08:00
Angus Gratton 8675a818f9 Merge branch 'master' into feature/esp32s2beta_merge 2019-10-22 13:51:49 +11:00
Ivan Grokhotkov c7d8ef52ca Merge branch 'fix/esp_flash_no_qe' into 'master'
esp_flash: fix the QE write issue in high freq, and support UT for external chips

Closes IDF-888

See merge request espressif/esp-idf!5736
2019-10-20 13:59:30 +08:00
Angus Gratton ae21d669b9 Merge branch 'master' into feature/esp32s2beta_merge 2019-10-17 18:22:08 +11:00
Darian 820fd6447d can: Add support for lower bit rates
This commit adds support for lower bit rates in the CAN Driver for
ESP32 Rev 2 or later chips.
2019-10-17 12:33:17 +08:00
Angus Gratton f5238d5e42 Merge branch 'feature/esp32s2beta' into feature/esp32s2beta_merge 2019-10-15 15:03:45 +11:00
Angus Gratton 496ede9bcd Merge branch 'master' into feature/esp32s2beta_merge 2019-10-15 14:59:27 +11:00
Michael (XIAO Xufeng) 15d311bb80 esp_flash: rename internal variables for better readability
chip_drv in HAL are renamed as host
2019-10-14 17:25:58 +08:00
Michael (XIAO Xufeng) 571864e8ae esp_flash: fix set qe bit and write command issues
There used to be dummy phase before out phase in common command
transactions. This corrupts the data.

The code before never actually operate (clear) the QE bit, once it finds
the QE bit is set. It's hard to check whether the QE set/disable
functions work well.

This commit:

1. Cancel the dummy phase

2. Set and clear the QE bit according to chip settings, allowing tests
   for QE bits. However for some chips (Winbond for example), it's not
   forced to clear the QE bit if not able to.

3. Also refactor to allow chip_generic and other chips to share the same
   code to read and write qe bit; let common command and read command share
   configure_host_io_mode.

4. Rename read mode to io mode since maybe we will write data with quad
   mode one day.
2019-10-14 17:25:58 +08:00