OVMS3-idf/components/esp32/test
Ivan Grokhotkov d3724dc35d esp_timer: fix occasional failures in "monotonic values" test
1. ref_clock used in unit tests occasionally produces time off by ~100
microseconds shortly after being started. Add a delay to let
ref_clock stabilise, until the cause is found.

2. Reduce roundoff error accumulation which would occasionally cause
the test to fail, by choosing an overflow value which can be divided
by APB frequency.

3. Move time sampling part of the test into an IRAM function to
reduce variations due to cache behavior.

4. Remove calculation of "standard deviation" in the test, as what was
calculated was not actually standard deviation, and it did not add any
useful information.
2019-02-26 02:01:29 +00:00
..
CMakeLists.txt cmake: separate app from idf lib project 2018-11-27 13:59:24 +08:00
component.mk unit-test: use TEST_GROUPS to filter tests for psram_vspi and psram_hspi 2018-11-15 12:27:05 +00:00
logo.jpg add unit tests to esp-idf 2016-11-22 14:45:50 +08:00
test_4mpsram.c test: Fix some unused identifier warnings 2018-12-10 12:34:16 +08:00
test_aes_sha_rsa.c unity: separate common and IDF specific functionality 2018-11-19 12:36:31 +08:00
test_ahb_arb.c component/soc : move dport access header files to soc 2017-05-09 18:06:00 +08:00
test_ahb_arb_asm.S add unit tests to esp-idf 2016-11-22 14:45:50 +08:00
test_attr.c esp32/test: split rtc_fast test cases 2018-09-29 14:02:16 +08:00
test_backtrace.c freertos: Make backtrace work across interrupts 2019-01-28 14:34:26 +08:00
test_delay.c unit test: adapt tests to single core configuration 2017-10-19 21:35:21 +08:00
test_dport.c unity: separate common and IDF specific functionality 2018-11-19 12:36:31 +08:00
test_esp_timer.c esp_timer: fix occasional failures in "monotonic values" test 2019-02-26 02:01:29 +00:00
test_ets_timer.c spi_flash: Expose an accessor the current SPI flash guard functions 2017-11-20 15:54:31 +11:00
test_fastbus.c unit tests: fix warnings, build with -Werror 2017-10-19 21:35:23 +08:00
test_fastbus_asm.S add unit tests to esp-idf 2016-11-22 14:45:50 +08:00
test_fp.c unit test: adapt tests to single core configuration 2017-10-19 21:35:21 +08:00
test_header_files_md5.c esp32/wpa_supplicant: fix some bugs introduced by wifi os adapter 2018-05-31 17:09:40 +08:00
test_himem.c Spiram: Add option to reserve MMU banks; add himem API to make use of those banks 2018-10-15 14:32:58 +08:00
test_intr_alloc.c driver(interrupt): fix the issue that interrupt might be allocated and freed on different cores 2018-09-26 10:31:09 +08:00
test_ipc.c ipc: fix esp_ipc_call_blocking to return after callback execution is completed 2018-09-07 14:19:35 +05:30
test_libgcc.c esp32: fix addresses of some libgcc functions in ROM ld script 2018-07-02 12:49:57 +08:00
test_miniz.c esp32: add [ignore] tag to some unit test cases for CI 2017-01-18 17:08:20 +08:00
test_phy_rtc.c Fix some bugs in phy 2019-01-16 22:41:17 +08:00
test_pm.c tests: use new CPU frequency setting API 2018-08-21 13:02:46 +08:00
test_random.c esp32: Add esp_fill_random() function 2018-09-03 04:39:45 +00:00
test_reset_reason.c driver(timer_group): fixed bug that init hw_timer caused cresh after system soft reset 2018-12-18 13:10:15 +08:00
test_sleep.c test: Fix some unused identifier warnings 2018-12-10 12:34:16 +08:00
test_spiram_cache_flush.c test: spiram: fix and enable test cases for default configuration 2018-11-19 22:40:14 +05:30
test_stack_check.c esp32: Adds Stack Smashing Protection Feature 2017-11-17 12:08:36 +03:00
test_stack_check_cxx.cpp esp32: Adds Stack Smashing Protection Feature 2017-11-17 12:08:36 +03:00
test_tjpgd.c add unit tests to esp-idf 2016-11-22 14:45:50 +08:00
test_tsens.c esp32,ulp: add tests for TSENS 2017-02-22 14:40:36 +08:00
test_unal_dma.c component/soc : move dport access header files to soc 2017-05-09 18:06:00 +08:00
test_wifi.c test: add test to check wifi conneciton between sta and softap 2019-01-10 09:51:17 +00:00
test_wifi_lib_git_commit.c test: Fix some unused identifier warnings 2018-12-10 12:34:16 +08:00