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OVMS3-idf
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56c309b40b
OVMS3-idf
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components
/
driver
/
test
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esp32
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michael
11fa11000f
spi: re-enable the unit tests for esp32s2beta
2019-12-23 10:22:59 +08:00
..
test_adc2.c
examples: modify other examples and tests to use esp_netif instead of tcpip_adapter
2019-11-13 12:36:25 +01:00
test_gpio.c
bugfix(gpio):fix esp32 s2 rtc io issue
2019-11-27 17:18:20 +08:00
test_i2c.c
bugfic(i2c): fix i2c driver ut issue.
2019-11-25 07:03:02 +00:00
test_pcnt.c
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
test_pwm.c
mcpwm: add HAL layer support
2019-11-25 00:36:30 +08:00
test_rmt.c
rmt: add HAL layer
2019-11-20 10:54:21 +08:00
test_rs485.c
ci: disable UTs for esp32s2beta without runners
2019-09-04 10:53:25 +10:00
test_sdio.c
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00