Using xxx_periph.h in whole IDF instead of xxx_reg.h, xxx_struct.h, xxx_channel.h ... .
Cleaned up header files from unnecessary headers (releated to soc/... headers).
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
1. ref_clock used in unit tests occasionally produces time off by ~100
microseconds shortly after being started. Add a delay to let
ref_clock stabilise, until the cause is found.
2. Reduce roundoff error accumulation which would occasionally cause
the test to fail, by choosing an overflow value which can be divided
by APB frequency.
3. Move time sampling part of the test into an IRAM function to
reduce variations due to cache behavior.
4. Remove calculation of "standard deviation" in the test, as what was
calculated was not actually standard deviation, and it did not add any
useful information.
New unity component can be used for testing other applications.
Upstream version of Unity is included as a submodule.
Utilities specific to ESP-IDF unit tests (partitions, leak checking
setup/teardown functions, etc) are kept only in unit-test-app.
Kconfig options are added to allow disabling certain Unity features.
Before entering the deep sleep, the RTC and FRC counters are synchronized. Updating the boot_time.
Added a unit test for this case.
Fixed warnings for MULTIPLE_STAGES
Closes https://github.com/espressif/esp-idf/issues/1840
Unit test runner expects to see the test name echoed after test
selection is made. If the unit test immediately goes into sleep mode,
UART output will not be complete, and test runner will not see the
test name. This flushes the stream buffer and waits for UART FIFO to
be empty before starting the test.
Additionally some parts of code used unity_printf and some used
printf. Since unity_printf was only useful during very early tests
when newlib was not available, replace all its usages with printf.
current unit-test-app don't support test components need to communicate
with each other (like GPIO, SPI ...). Now we add multiple devices mode
to unit test app, support writing and running test with multiple DUTs.
please refer to `docs/api-guides/unit-tests.rst` for detail.
