This commit updates the esp_adc_cal ocmponent to support new calibration methods
which utilize calibratoin values stored in eFuse. This commit includes LUT mode
requirement from github(https://github.com/espressif/esp-idf/issues/805): to provide the position in the buffer of the pattern detected.
requirement from AT application: in AT app, when no hardware flow control is enabled, in some situation the rx buffer might be full, and the terminator “+++” might be lost, we can use pattern detect interrupt to avoid missing the terminator. When pattern detect interrupt happens, it will not send a data event at the same time.
1. Add API to get position of detected pattern in rx buffer
2. Modify UART event example
3. Add comments for uart_flush, add alias API uart_flush_input to clear the rx buffer
4. Modify the way rx_buffered_len is calculated
Reported from different sources from github or bbs:
https://github.com/espressif/esp-idf/issues/680https://github.com/espressif/esp-idf/issues/922
We tested reading several sensor or other I2C slave devices, if the power and SDA/SCL wires are in proper condition, everything works find with reading the slave.
If we remove the power supply for the slave during I2C is reading, or directly connect SDA or SCL to ground, this would cause the I2C FSM get stuck in wrong state, all we can do is the reset the I2C hardware in this case.
After this commit, no matter whether the power supply of I2C slave is removed or SDA / SCL are shorted to ground, the driver can recover from wrong state.
We are not sure whether this the save issue with the reported one yet, but to make the driver more robust.
Further information:
1. For I2C master mode, we have tested different situations, e.g., to short the SDA/SCL directly to GND/VCC, to short the SDA to SCL, to un-plug the slave device, to power off the slave device. Under all of those situations, this version of driver can recover and keep working.
2. Some slave device will die by accident and keep the SDA in low level, in this case, master should send several clock to make the slave release the bus.
3. Slave mode of ESP32 might also get in wrong state that held the SDA low, in this case, master device could send a stop signal to make esp32 slave release the bus.
Modifications:
1. Disable I2C_MASTER_TRAN_COMP interrupt to void extra interrupt.
2. Disable un-used timeout interrupt for slave.
3. Add bus reset if error detected for master mode.
4. Add bus clear if SDA level is low when error detected.
5. Modify the argument type of i2c_set_pin.
6. add API to set timeout value
7. add parameter check for timing APIs
using apll_param to setup APLL
new apll calculation method, much faster
validate freq calculation
Ensure that the i2s frequency is greater than the hardware limit
Add description of how to calculate apll clock, support apll for other 16-bits audio, check rev0 chip
correct space
1. Support built-in ADC for I2S.
2. Modify code of ADC, made no change to the original APIs.
3. Add APIs in I2S:
esp_err_t i2s_set_adc_mode(adc_unit_t adc_unit, adc1_channel_t adc_channel);
4. Add I2S ADC/DAC example code.
5. add old-fashion definition to make it more compatible
6. replase spi_flash_ APIs with esp_partition_ APIs
7. add example of generating audio table from wav
8. change example sound
Added component containg API that is able to correct raw ADC readings
into a voltage in mV. Also provided a helper function that combines
the process of getting the raw ADC1 reading then converting it to a
voltage in mV. In doing so, the adc1_get_voltage() function of the ADC
driver has been deprecated. Instead there is now adc1_get_raw to obtain
the raw ADC1 reading, and adc1_to_voltage() that gets the raw reading
and converts all in one function. Functions using the deprecated
adc1_get_voltage() have also been updated to use adc1_get_raw().
Conversion is based on ADC characteristics. The characteristics are based
on the ADC's v_ref, herefore the appropriate structure and functions have
been provided to obtain the ADC characteristics.
The existing ADC driver has also been modified by adding a function to
route the internal ADC reference voltage to a GPIO allowing users to measure
it manually.
Relevant documentation has also been updated
1. add sens_struct.h
2. add definition of RTCCNTL and RTCIO
3. modify touch pad examples
4. update example code.
5. add comments add option in menuconfig
6. fix issue that pad index 8 and 9 are mismatched
7. add touch_pad_read_filtered() api to get value filtered by iir filter
8. modify touch pad isr func
9. Make the items in perihperal.ld in the sequence of address
10. delete Kconfig for touch pad
11. add touchpad filter APIs to adjust the filter
12. add touch_pad into index.rst
13. add touch_pad in Doxyfile
14. add touch_pad.rst
1. Rename api from rmt_get_ringbuf_handler to rmt_get_ringbuf_handle (Github Issue #274)
2. doxygen param rename
3. change API rmt_wait_tx_done to specify maximum waiting time
4.Change return type of rmt_wait_tx_done API from bool to esp_err_t
5. update doc
unused variable 'lfn'
'isr_handler' defined but not used
'servo_set_angle' defined but not used
'gpio_test_signal' defined but not used
'change_duty' defined but not used
1. Name change from chopper to carrier, block diagram update, minor changes to example codes
2. mcpwm_reg.h changed, brought uniformity in comments, worked on suggestions, duty to accept float. Some name changes!
3. Minor readme changes and Indetation
4. Minor change: move mcpwm_reg.h and mcpwm_struct.h to new path
5. Minor change: addition of BLDC example code and Readme
6. Name changed from epwm to mcpwm
7. Improve the reg name in mcpwm_struct.h
8. Name change chopper>carrier, deadband>deadtime
I2S driver - fixed support for 24 and 32-bits, fixed tx/rx at the same time
- Modify sample can test with 24, 32-bits audio
- Add i2s sample README
- simply i2s_push function
- change sample rates, bits per sample, channel on fly
See merge request !483
Add support 24, 32 bits
@jxmao optimize i2s_zero_buffer
@jxmao correct config support slave mode
@jxmao correct setup pin support tx/rx at the same time
Enhance pin power
@jxmao add dynamic change number of channels
remove nvs_init
remove start log and enhance power pin setup
using enum for i2s_channel and i2s_bits_per_sample, return ESP_ERR_INVALID_ARG when check params
validate i2s_bits_per_sample and channel
check tx & rx buffer before fill zero
remove checking channel as @jxmao suggest
limit dma buffer
modify i2s pin back to gpio mux before configure gpio matrix, resolve github issue #512
Add support 24, 32 bits
reduce push function
Modify sample can test with 24, 32-bits
Add i2s sample README
Fixed i2s_set_clk got reset sometime
can changes bit-wide while running
Fix sample rate calculation for DAC mode from @jeroen
modify example can change bits per sample every 5 seconds
cleanup
add comment for bytes_per_sample
update as @angus suggestions
Add i2s_set_clk api
I2S driver bug fixed as following log:
@jxmao optimize i2s_zero_buffer
@jxmao correct config support slave mode
@jxmao correct setup pin support tx/rx at the same time
Enhance pin power
@jxmao add dynamic change number of channels
remove nvs_init
remove start log and enhance power pin setup
using enum for i2s_channel and i2s_bits_per_sample, return ESP_ERR_INVALID_ARG when check params
validate i2s_bits_per_sample and channel
check tx & rx buffer before fill zero
remove checking channel as @jxmao suggest
limit dma buffer
modify i2s pin back to gpio mux before configure gpio matrix, resolve github issue #512
limit dma buffer to 4092
change gpio_matrix_*_check to inline function, remove some comments and rename test_i2s function to setup_triangle_sine_waves
for change commit title
* Use "example" in all example function & variable names,
ie use i2c_example_xxx instead of i2c_xxx for example functions.
Closes#198https://github.com/espressif/esp-idf/issues/198
* Mark example functions, etc. static
* Replace uses of "test" & "demo" with "example"
* Split the UART example into two
* Rename "main" example files to end with "_main.c" for disambiguation
Error handling in NVS initialization
Previously nvs_flash_init worked under an assumption that there should always be at least one free page available. This is true during normal operation, but in some cases (such as when changing application partition table from a non-OTA to an OTA one), NVS partition may get truncated, which will cause empty pages to be lost.
This MR adds error checks for this condition, and updates code which calls `nvs_flash_init` to check for the return code.
For most examples, a simple `ESP_ERROR_CHECK` is added around `nvs_flash_init`. For NVS examples and the OTA example, more robust error handling is added.
This change also removes nvs_flash_init calls from examples which don't use NVS.
See merge request !582
1. Add low speed channels for LEDC module.
2. Improve fade object allocate mechanism.
3. Improve ledc example, add 2 low speed channels in example.
4. Remove debug code
5. Improve the register bit field name of slow clock.
