This commit fixes multiple bugs caused by incorrect calls to
can_enter_reset_mode() and can_exit_reset_mode. Example test
scripts also updated to match new runners.
Acquires PM_APB_FREQ_MAX lock when carrying any transaction on I2S if
Power Management Framework is enabled.
Signed-off-by: Sachin Parekh <sachin.parekh@espressif.com>
Acquires PM_APB_FREQ_MAX lock when carrying any transaction on I2C if
Power Management Framework is enabled.
Signed-off-by: Sachin Parekh <sachin.parekh@espressif.com>
There are lot of prints of `Allocate TX buffer for DMA`
Changed these from `ESP_LOGI` to `ESP_LOGD`
Signed-off-by: Vikram Dattu <vikram.dattu@espressif.com>
This commits adds the functions can_clear_transmit_queue() and
can_clear_receive_queue(). Closes#2906
The following bug are fixed:
- CAN_IO_UNUSED is now explicitly cast to enum type. Closes#2825
- Fix multiple documentation errors. Closes#2898, Closes#2794
- can_reconfigure_alerts() returns incorrect current_alerts. Closes#3028
- Add missing header file. Closes#3065
The requirements of pin capabilites is different for spi master and
slave. The master needs CS, SCLK, MOSI to be output-able, while slave
needs MISO to be output-able.
Previous code is for master only.
This commit allows to place other 3 pins than MISO on input-only pins
for slaves. Refactoring for spi_common is also included.
Resolves https://github.com/espressif/esp-idf/issues/2455
New unit tests added
------------------------
**Local:** Local test uses the GPIO matrix to connect the master and the
slave on the same board. When the master needs the iomux, the master
uses the GPIOs of its own, the slave connect to the pins by GPIO matrix;
When the slave needs the iomux, the slave uses the GPIOs of its own, the
master connects to the pins by GPIO matrix.
- Provide a new unit test which performs freq scanning in mode 0. It
scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum
frequency allowed.
**M & S**: Master & slave tests performs the test with two boards. The
master and slave use iomux or gpio matrix according to the config.
- Provide a new unit test which performs freq scanning in mode 0. It
scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum
frequency allowed.
- Provide a new unit test which performs mode test with significant
frequencies. It tests mode 0,1,2,3 with low frequency, and the maximum
frequency allowed.
Paremeterized Test Framework
-----------------------------
The SPI has a lot of parameters, which works in the same process.
This framework provides a way to easily test different parameter sets.
The framework can work in two different ways:
- local test: which requires only one board to perform the test - master
& slave test: which generates two sub test items which uses the same
config set to cooperate to perform the test.
The user defines a (pair if master/slave) set of init/deinit/loop
functions. Then the test framework will call init once, then call loop
several times with different configurations, then call deinit.
Then a unit test can be appended by add a parameter group, and pass it into
a macro.
