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i2s: test case for variation in apll clock rate

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This commit is contained in:
Ajita Chavan 2019-06-19 16:06:20 +05:30 committed by Mahavir Jain
parent cfc73a6de7
commit 13e6e9f592
3 changed files with 72 additions and 0 deletions
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9
components/driver/i2s.c
View file

@ -90,6 +90,7 @@ typedef struct {
bool use_apll; /*!< I2S use APLL clock */
bool tx_desc_auto_clear; /*!< I2S auto clear tx descriptor on underflow */
int fixed_mclk; /*!< I2S fixed MLCK clock */
double real_rate;
} i2s_obj_t;
static i2s_obj_t *p_i2s_obj[I2S_NUM_MAX] = {0};
@ -176,6 +177,12 @@ esp_err_t i2s_enable_tx_intr(i2s_port_t i2s_num)
return ESP_OK;
}
float i2s_get_clk(i2s_port_t i2s_num)
{
I2S_CHECK((i2s_num < I2S_NUM_MAX), "i2s_num error", ESP_ERR_INVALID_ARG);
return p_i2s_obj[i2s_num]->real_rate;
}
static esp_err_t i2s_isr_register(i2s_port_t i2s_num, int intr_alloc_flags, void (*fn)(void*), void * arg, i2s_isr_handle_t *handle)
{
return esp_intr_alloc(ETS_I2S0_INTR_SOURCE + i2s_num, intr_alloc_flags, fn, arg, handle);
@ -463,6 +470,7 @@ esp_err_t i2s_set_clk(i2s_port_t i2s_num, uint32_t rate, i2s_bits_per_sample_t b
I2S[i2s_num]->sample_rate_conf.rx_bck_div_num = m_scale;
I2S[i2s_num]->clkm_conf.clka_en = 1;
double fi2s_rate = i2s_apll_get_fi2s(bits, sdm0, sdm1, sdm2, odir);
p_i2s_obj[i2s_num]->real_rate = fi2s_rate/bits/channel/m_scale;
ESP_LOGI(I2S_TAG, "APLL: Req RATE: %d, real rate: %0.3f, BITS: %u, CLKM: %u, BCK_M: %u, MCLK: %0.3f, SCLK: %f, diva: %d, divb: %d",
rate, fi2s_rate/bits/channel/m_scale, bits, 1, m_scale, fi2s_rate, fi2s_rate/8, 1, 0);
} else {
@ -473,6 +481,7 @@ esp_err_t i2s_set_clk(i2s_port_t i2s_num, uint32_t rate, i2s_bits_per_sample_t b
I2S[i2s_num]->sample_rate_conf.tx_bck_div_num = bck;
I2S[i2s_num]->sample_rate_conf.rx_bck_div_num = bck;
double real_rate = (double) (I2S_BASE_CLK / (bck * bits * clkmInteger) / 2);
p_i2s_obj[i2s_num]->real_rate = real_rate;
ESP_LOGI(I2S_TAG, "PLL_D2: Req RATE: %d, real rate: %0.3f, BITS: %u, CLKM: %u, BCK: %u, MCLK: %0.3f, SCLK: %f, diva: %d, divb: %d",
rate, real_rate, bits, clkmInteger, bck, (double)I2S_BASE_CLK / mclk, real_rate*bits*channel, 64, clkmDecimals);
}

10
components/driver/include/driver/i2s.h
View file

@ -503,6 +503,16 @@ esp_err_t i2s_zero_dma_buffer(i2s_port_t i2s_num);
*/
esp_err_t i2s_set_clk(i2s_port_t i2s_num, uint32_t rate, i2s_bits_per_sample_t bits, i2s_channel_t ch);
/**
* @brief get clock set on particular port number.
*
* @param i2s_num I2S_NUM_0, I2S_NUM_1
*
* @return
* - actual clock set by i2s driver
*/
float i2s_get_clk(i2s_port_t i2s_num);
/**
* @brief Set built-in ADC mode for I2S DMA, this function will initialize ADC pad,
* and set ADC parameters.

53
components/driver/test/test_i2s.c
View file

@ -9,6 +9,7 @@
#include "freertos/task.h"
#include "driver/i2s.h"
#include "unity.h"
#include "math.h"
#define SAMPLE_RATE (36000)
#define SAMPLE_BITS (16)
@ -18,6 +19,7 @@
#define SLAVE_WS_IO 26
#define DATA_IN_IO 21
#define DATA_OUT_IO 22
#define PERCENT_DIFF 0.0001
/**
* i2s initialize test
@ -267,3 +269,54 @@ TEST_CASE("I2S memory leaking test", "[i2s]")
vTaskDelay(100 / portTICK_PERIOD_MS);
TEST_ASSERT(initial_size == esp_get_free_heap_size());
}
/*
* The I2S APLL clock variation test used to test the difference between the different sample rates, different bits per sample
* and the APLL clock generate for it. The TEST_CASE passes PERCENT_DIFF variation from the provided sample rate in APLL generated clock
* The percentage difference calculated as (mod((obtained clock rate - desired clock rate)/(desired clock rate))) * 100.
*/
TEST_CASE("I2S APLL clock variation test", "[i2s]")
{
i2s_pin_config_t pin_config = {
.bck_io_num = MASTER_BCK_IO,
.ws_io_num = MASTER_WS_IO,
.data_out_num = DATA_OUT_IO,
.data_in_num = -1
};
i2s_config_t i2s_config = {
.mode = I2S_MODE_MASTER | I2S_MODE_TX,
.sample_rate = SAMPLE_RATE,
.bits_per_sample = SAMPLE_BITS,
.channel_format = I2S_CHANNEL_FMT_RIGHT_LEFT,
.communication_format = I2S_COMM_FORMAT_I2S,
.dma_buf_count = 6,
.dma_buf_len = 60,
.use_apll = true,
.intr_alloc_flags = 0,
};
TEST_ESP_OK(i2s_driver_install(I2S_NUM_0, &i2s_config, 0, NULL));
TEST_ESP_OK(i2s_set_pin(I2S_NUM_0, &pin_config));
TEST_ESP_OK(i2s_driver_uninstall(I2S_NUM_0));
int initial_size = esp_get_free_heap_size();
uint32_t sample_rate_arr[8] = { 10675, 11025, 16000, 22050, 32000, 44100, 48000, 96000 };
int bits_per_sample_arr[3] = { 16, 24, 32 };
for (int i = 0; i < (sizeof(sample_rate_arr)/sizeof(sample_rate_arr[0])); i++) {
for (int j = 0; j < (sizeof(bits_per_sample_arr)/sizeof(bits_per_sample_arr[0])); j++) {
i2s_config.sample_rate = sample_rate_arr[i];
i2s_config.bits_per_sample = bits_per_sample_arr[j];
TEST_ESP_OK(i2s_driver_install(I2S_NUM_0, &i2s_config, 0, NULL));
TEST_ESP_OK(i2s_set_pin(I2S_NUM_0, &pin_config));
TEST_ASSERT((fabs((i2s_get_clk(I2S_NUM_0) - sample_rate_arr[i]))/(sample_rate_arr[i]))*100 < PERCENT_DIFF);
TEST_ESP_OK(i2s_driver_uninstall(I2S_NUM_0));
TEST_ASSERT(initial_size == esp_get_free_heap_size());
}
}
vTaskDelay(100 / portTICK_PERIOD_MS);
TEST_ASSERT(initial_size == esp_get_free_heap_size());
}