Commit graph

102 commits

Author SHA1 Message Date
Michael (XIAO Xufeng)
c7a9851de0 Merge branch 'bugfix/fix_bugs_in_gpio_unit_test_v3.3' into 'release/v3.3'
bugfix(ut): fix gpio output and input mode test(backport v3.3)

See merge request espressif/esp-idf!10023
2020-09-18 02:17:42 +08:00
Michael (XIAO Xufeng)
6552aef2e7 driver test: disable the spi master performance test when psram is used 2020-09-01 16:41:59 +00:00
Chen Yi Qun
c2ead692aa bugfix(ut): fix gpio output and input mode test(backport v3.3) 2020-08-20 06:25:40 +00:00
aleks
b64f4bced8 ci: temporarily disable RS485 related tests 2020-07-22 08:46:57 +00:00
Michael (XIAO Xufeng)
c9edf16376 mcpwm: decrease test time
cherry-pick 538540ce
2020-02-21 22:39:12 +08:00
michael
3c6f992cf0 mcpwm: enable some unit tests again 2020-02-21 22:39:03 +08:00
Konstantin Kondrashov
f2dfb0cf70 driver: Add uart and i2c UTs to check ticks_to_wait in some functions 2019-10-21 07:32:25 +00:00
kooho
0929dbbc9b bugfix(GPIO): Fixed the bug that GPIO enables interrupts on one core,
but registers interrupt service routines on another core for release/v3.3
2019-08-06 03:20:11 +00:00
Ajita Chavan
13e6e9f592 i2s: test case for variation in apll clock rate 2019-07-04 18:27:12 +05:30
Sachin Parekh
ae1389afd9 unit-test-app: freertos_compliance config added
Signed-off-by: Sachin Parekh <sachin.parekh@espressif.com>
2019-06-25 04:33:32 +00:00
He Yin Ling
8f3fe52b5a test: temp disable spi master slave mode test 2019-03-10 06:21:37 +00:00
michael
12a6664afa spi test: describe the wiring of param test in the comments 2019-02-28 19:43:58 +08:00
Michael (XIAO Xufeng)
86bcd56109 spi: fix the bug of connecting SPI peripheral to read-only pins
The requirements of pin capabilites is different for spi master and
slave.  The master needs CS, SCLK, MOSI to be output-able, while slave
needs MISO to be output-able.

Previous code is for master only.

This commit allows to place other 3 pins than MISO on input-only pins
for slaves. Refactoring for spi_common is also included.

Resolves https://github.com/espressif/esp-idf/issues/2455
2019-02-16 20:03:14 +08:00
michael
41e58bc419 spi: add new test for timing and mode
New unit tests added
------------------------

**Local:** Local test uses the GPIO matrix to connect the master and the
slave on the same board. When the master needs the iomux, the master
uses the GPIOs of its own, the slave connect to the pins by GPIO matrix;
When the slave needs the iomux, the slave uses the GPIOs of its own, the
master connects to the pins by GPIO matrix.

- Provide a new unit test which performs freq scanning in mode 0. It
scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum
frequency allowed.

**M & S**: Master & slave tests performs the test with two boards. The
master and slave use iomux or gpio matrix according to the config.

- Provide a new unit test which performs freq scanning in mode 0. It
scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum
frequency allowed.

- Provide a new unit test which performs mode test with significant
frequencies. It tests mode 0,1,2,3 with low frequency, and the maximum
frequency allowed.
2019-01-26 00:10:41 +08:00
michael
58955a79a2 spi_slave: improve the timing configuration
SPI Slave
===========

- Correct the configuration of mode 0~3 using new config in the TRM
- Split the workaround for DMA in mode 0/2 out of normal config, to make it clear.
- Update timing and speed document for the SPI slave.

Resolves https://github.com/espressif/esp-idf/issues/1346, https://github.com/espressif/esp-idf/issues/2393
2019-01-26 00:10:41 +08:00
michael
d9c5016e08 test: add new test framework for different configurations
Paremeterized Test Framework
-----------------------------

The SPI has a lot of parameters, which works in the same process.
This framework provides a way to easily test different parameter sets.
The framework can work in two different ways:

- local test: which requires only one board to perform the test - master
& slave test: which generates two sub test items which uses the same
config set to cooperate to perform the test.

The user defines a (pair if master/slave) set of init/deinit/loop
functions. Then the test framework will call init once, then call loop
several times with different configurations, then call deinit.

Then a unit test can be appended by add a parameter group, and pass it into
a macro.
2019-01-26 00:10:41 +08:00
Anton Maklakov
81bf07ed4d test: Fix some unused identifier warnings 2018-12-10 12:34:16 +08:00
Jeroen Domburg
d6ee27e313 Merge branch 'feat/spi_check_length_buffer' into 'master'
spi: add checks for slave buffer valid and master length

See merge request idf/esp-idf!3744
2018-12-04 11:48:32 +08:00
houchenyao
147447b13e test: components/driver: i2c case 2018-11-29 18:27:58 +08:00
houchenyao
44fdca94e9 test: components/driver: i2s case 2018-11-29 11:32:40 +08:00
houchenyao
11faab2c5d test: components/driver: pwm case 2018-11-28 10:42:32 +08:00
michael
cfba157fdd spi_slave: add valid check for DMA buffers
The DMA cannot receive data correctly when the buffer address is not
WORD aligned. Currently we only check whether the buffer is in the DRAM
region.

The DMA always write in WORDs, so the length arguments should also be
multiples of 32 bits.

A check is added to see whether the buffer is WORD aligned and has valid
length.
2018-11-26 03:49:26 +00:00
Ivan Grokhotkov
6091021e83 unity: separate common and IDF specific functionality
New unity component can be used for testing other applications.
Upstream version of Unity is included as a submodule.
Utilities specific to ESP-IDF unit tests (partitions, leak checking
setup/teardown functions, etc) are kept only in unit-test-app.
Kconfig options are added to allow disabling certain Unity features.
2018-11-19 12:36:31 +08:00
Michael (XIAO Xufeng)
90d229eb6d spi_master: speed up polling performance by putting into IRAM 2018-10-25 12:31:45 +08:00
Michael (XIAO Xufeng)
d0361a32d7 test: fix the IRAM type conflict issue using heap_caps_malloc 2018-10-25 12:31:44 +08:00
Angus Gratton
38bd836d05 Merge branch 'feature/cmake-unit-test' into 'master'
cmake: add unit tests build support

See merge request idf/esp-idf!3003
2018-10-22 16:29:15 +08:00
Anton Maklakov
e3fce506b8 test_spi_slave: fix warnings about unused identifiers 2018-10-21 15:11:45 +08:00
Renz Bagaporo
cc774111bf cmake: Add support for test build 2018-10-20 12:07:24 +08:00
Ivan Grokhotkov
0663ab7609 Merge branch 'feature/uart_rs485_test' into 'master'
driver: rs485 test support

See merge request idf/esp-idf!2701
2018-10-19 13:05:55 +08:00
Angus Gratton
159ff6e08e unit tests: Only initialise tcpip_adapter() when needed by the test
Prevents unexpected memory allocations when running tests which
don't require tcpip_adapter.
2018-10-17 22:53:46 +00:00
Alex Lisitsyn
5b7b64b946 driver: rs485 test support (remove timeout tag)
Adds test functionality with TEST_CASE_MULTIPLE_DEVICES() macro for RS485 test support.
2018-10-17 12:47:12 +02:00
Alex Lisitsyn
61bc733791 driver: rs485 test support
Adds test functionality with TEST_CASE_MULTIPLE_DEVICES() macro for RS485 test support.
2018-10-17 12:45:56 +02:00
Angus Gratton
05c510b44e Merge branch 'test/spi_slave_psram_disable' into 'master'
test: disable the spi slave startup test when psram is enabled

See merge request idf/esp-idf!3373
2018-10-08 16:28:41 +08:00
michael
6b180f70ac test: modify the command/address test a bit to test the LSBFIRST feature 2018-10-04 15:03:26 +08:00
michael
f4d4183000 test: disable the spi slave startup test when psram is enabled 2018-09-26 17:55:37 +08:00
Michael (Xiao Xufeng)
4af51833f3 spi_master: add new polling mode to decrease time cost each transaction 2018-09-20 19:46:46 +08:00
houchenyao
0cfed0b79b rmt test: add the case for bug in github[#1815] 2018-09-06 19:43:30 +08:00
houchenyao
47fcdeaa0b rmt test: add case test test the bug of re-install problem
add pending bug case:rmt_tx_stop function cause the re-install fail when rmt_config_t.tx_config.loop_en==true
2018-09-06 19:43:30 +08:00
houchenyao
09dd1034de rmt test: add case to check memory block.
add RMT channel num and memory block relationship test case to check the memory block range is used in right way.
2018-09-06 19:43:30 +08:00
houchenyao
836d01dcea ledc test: ignore one case.
a bug caused by pcnt. it will fail randomly caused by PCNT bug. It will open when PCNT problem is resolved
2018-09-06 19:43:30 +08:00
houchenyao
f647ea81cc pcnt test: ignore pcnt two test cases
a bug caused by pcnt. these two cases has about 10% fail ratio. they fail randomly in CI. stress test needed. they are ignored until this bug fixed.
2018-09-06 19:42:20 +08:00
houchenyao
22ac8cf424 ledc test: test low speed mode frequency.
remove the comment to test the scenario that ledc in low speed mode frequency can be changed, to make sure the bug has been resolved
2018-09-06 17:44:39 +08:00
houchenyao
98c868ff09 gpio test: add GPIO multi-level interrupt test
add case to test the bug of v3.0. If we trigger the level interrupt more than once, will cause the interrupt be triggered many times
2018-09-06 17:43:23 +08:00
Ivan Grokhotkov
9ba5896d86 driver, ethernet: fix non-static inline functions
See https://gcc.gnu.org/bugzilla/show_bug.cgi?id=81734
2018-08-29 12:49:15 +08:00
Ivan Grokhotkov
fc0c110efd driver: test: fix memset out of bounds in spi_master test 2018-08-29 12:49:15 +08:00
michael
404e99965d spi_master: change high part config to allow transactions of 64 bytes 2018-08-16 18:55:09 +08:00
Angus Gratton
5f56f2ca01 Merge branch 'feature/nvs_version_check' into 'master'
nvs_flash: Version compatibility check for nvs storage

See merge request idf/esp-idf!2855
2018-08-07 13:31:49 +08:00
kooho
2d0af81ccf driver(uart): Fixed uart tx_empty interrupt wdt timeout bug. 2018-08-05 06:34:34 +00:00
Sagar Bijwe
1df85e0039 nvs_flash: Version compatibility check for nvs storage
This change adds a check for compatibility between the nvs version
found on nvs flash and the one assumed by running code during nvs
initialization. Any mismatch is reported to the user using new error
code ESP_ERR_NVS_NEW_VERSION_FOUND.
2018-08-05 00:00:56 +00:00
Michael (XIAO Xufeng)
0aa52057ed spi_master: enable 2 tests in CI
The test is previously disabled for the requirement of external
connection. Now the signals are connected by internal connections.
Also change the failure logic of the test.
2018-07-31 18:04:51 +08:00