Ivan Grokhotkov cc67500d3e unit test: adapt tests to single core configuration		2017-10-19 21:35:21 +08:00
..
component.mk	add unit tests to esp-idf	2016-11-22 14:45:50 +08:00
test_cache_disabled.c	add test case for invalid cache access interrupt	2017-04-13 15:27:39 +08:00
test_flash_encryption.c	unit tests: Use a unit test app partition table, configure spi_flash to use data partition	2017-02-22 10:26:04 +11:00
test_large_flash_writes.c	spi_flash: Fix SPI flash write alignment/size bugs	2017-06-09 17:33:27 +10:00
test_mmap.c	This commit adds spi_flash_mmap_pages(), a function to map a set of unordered 64K pages in flash into a contiguous region in memory space.	2017-06-23 14:28:57 +08:00
test_partitions.c	spi_flash: Fixed bug in SPI flash ROM driver to work with embedded flash chip	2017-04-11 10:51:19 +08:00
test_read_write.c	spi_flash: Fixed bug in SPI flash ROM driver to work with embedded flash chip	2017-04-11 10:51:19 +08:00
test_spi_flash.c	unit test: adapt tests to single core configuration	2017-10-19 21:35:21 +08:00