d9c5016e08
Paremeterized Test Framework ----------------------------- The SPI has a lot of parameters, which works in the same process. This framework provides a way to easily test different parameter sets. The framework can work in two different ways: - local test: which requires only one board to perform the test - master & slave test: which generates two sub test items which uses the same config set to cooperate to perform the test. The user defines a (pair if master/slave) set of init/deinit/loop functions. Then the test framework will call init once, then call loop several times with different configurations, then call deinit. Then a unit test can be appended by add a parameter group, and pass it into a macro.
22 lines
673 B
C
22 lines
673 B
C
#include "param_test.h"
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#include "esp_log.h"
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void test_serializer(const param_group_t *param_group, const ptest_func_t* test_func)
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{
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ESP_LOGI("test", "run test: %s", param_group->name);
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//in this test case, we want to make two devices as similar as possible, so use the same context
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void *context = NULL;
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test_func->pre_test(&context);
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void *pset = param_group->param_group;
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for (int i = param_group->pset_num; i >0; i--) {
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if (test_func->def_param) test_func->def_param(pset);
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test_func->loop(pset, context);
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pset+=param_group->pset_size;
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}
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test_func->post_test(context);
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free(context);
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context = NULL;
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}
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