OVMS3-idf/components/driver/test
Angus Gratton 870fa2237e driver test: Ensure uart write task can't overflow buffer of read task
Previously both tasks had equal priority, possible for write task and another
internal task to be scheduled at the same time - starving read task and
causing data loss.

Related to IDFCI-59
2020-07-10 15:59:48 +10:00
..
adc_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
dac_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
include/test global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test driver(touch): fix touch sensor denoise unit test case 2020-07-02 13:04:46 +08:00
CMakeLists.txt driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c driver(adc/dac): fix adc dac driver for esp32s2 2020-04-01 12:41:51 +08:00
test_adc_common.c driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_common_spi.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_dac.c driver(adc): add adc initial code before app_main for esp32s2. 2020-04-04 10:15:30 +08:00
test_gpio.c GPIO: fix unit test issue on ESP32-S2 2020-02-26 11:12:09 +08:00
test_i2c.c I2C: i2c.h/i2c.c applied new code formatting 2020-02-26 15:12:03 +08:00
test_i2s.c driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
test_ledc.c ci: disable case witout runners 2020-02-15 18:28:25 +08:00
test_pcnt.c bugfix(pcnt): fix driver ut pcnt 2020-02-26 16:52:53 +08:00
test_pwm.c ut: Move tests back from "esp32" subfolder 2020-01-06 17:13:53 +08:00
test_rmt.c rmt: prefix caps name with SOC_ 2020-03-25 17:14:00 +08:00
test_rs485.c global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
test_rtcio.c rtcio: add hal for driver 2019-11-21 10:40:49 +08:00
test_sdio.c sdio: fix the unit of performance test 2020-05-12 12:25:46 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c test: driver/sigmadelta test case 2018-06-13 10:15:06 +08:00
test_spi_bus_lock.c spi: fix config break and reduce overhead of the bus lock on SPI1 2020-04-22 16:06:13 +08:00
test_spi_master.c spi: allow using esp_flash and spi_master driver on the same bus 2020-03-26 22:08:26 +08:00
test_spi_param.c spi: add unit test for slave receiving length 2020-03-11 13:24:30 +08:00
test_spi_sio.c global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
test_spi_slave.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_timer.c driver/timer: fix software reset UT (again) 2019-11-24 21:10:50 +01:00
test_uart.c driver test: Ensure uart write task can't overflow buffer of read task 2020-07-10 15:59:48 +10:00