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adc_dma_test
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driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
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2020-06-01 15:00:08 +08:00 |
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dac_dma_test
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driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
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2020-05-18 19:55:30 +08:00 |
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include/test
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driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
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2020-06-01 15:00:08 +08:00 |
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param_test
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driver: Rename "local" tests to "single board" tests, add some description to the names
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2019-12-12 11:05:04 +11:00 |
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touch_sensor_test
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driver(touch): fix touch sensor denoise unit test case
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2020-06-19 22:15:51 +08:00 |
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CMakeLists.txt
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driver(adc): fix adc io init bug; add unit test to check;
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2020-05-12 06:52:26 +00:00 |
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component.mk
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driver(adc): fix adc io init bug; add unit test to check;
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2020-05-12 06:52:26 +00:00 |
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test_adc2_with_wifi.c
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driver(adc/dac): fix adc dac driver for esp32s2
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2020-04-01 12:41:51 +08:00 |
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test_adc_common.c
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driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
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2020-06-01 15:00:08 +08:00 |
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test_common_spi.c
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spi: re-enable the unit tests for esp32s2beta
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2019-12-23 10:22:59 +08:00 |
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test_dac.c
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driver(adc): add adc initial code before app_main for esp32s2.
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2020-04-04 10:15:30 +08:00 |
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test_gpio.c
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GPIO: fix unit test issue on ESP32-S2
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2020-02-26 11:12:09 +08:00 |
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test_i2c.c
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I2C: i2c.h/i2c.c applied new code formatting
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2020-02-26 15:12:03 +08:00 |
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test_i2s.c
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driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
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2020-05-18 19:55:30 +08:00 |
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test_ledc.c
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ci: disable case witout runners
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2020-02-15 18:28:25 +08:00 |
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test_pcnt.c
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bugfix(pcnt): fix driver ut pcnt
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2020-02-26 16:52:53 +08:00 |
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test_pwm.c
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ut: Move tests back from "esp32" subfolder
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2020-01-06 17:13:53 +08:00 |
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test_rmt.c
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rmt: prefix caps name with SOC_
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2020-03-25 17:14:00 +08:00 |
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test_rs485.c
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global: rename esp32s2beta to esp32s2
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2020-01-22 12:14:38 +08:00 |
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test_rtcio.c
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rtcio: add hal for driver
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2019-11-21 10:40:49 +08:00 |
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test_sdio.c
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sdio: fix the unit of performance test
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2020-05-12 12:25:46 +08:00 |
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test_sdmmc_sdspi_init.cpp
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sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards
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2020-02-12 15:16:08 +08:00 |
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test_sigmadelta.c
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test: driver/sigmadelta test case
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2018-06-13 10:15:06 +08:00 |
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test_spi_bus_lock.c
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spi: fix config break and reduce overhead of the bus lock on SPI1
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2020-04-22 16:06:13 +08:00 |
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test_spi_master.c
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spi: allow using esp_flash and spi_master driver on the same bus
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2020-03-26 22:08:26 +08:00 |
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test_spi_param.c
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spi: add unit test for slave receiving length
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2020-03-11 13:24:30 +08:00 |
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test_spi_sio.c
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global: rename esp32s2beta to esp32s2
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2020-01-22 12:14:38 +08:00 |
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test_spi_slave.c
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spi: re-enable the unit tests for esp32s2beta
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2019-12-23 10:22:59 +08:00 |
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test_timer.c
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bugfix(timer): improve timer unit test case
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2020-06-15 16:12:51 +08:00 |
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test_uart.c
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driver: make sure UART is idle before starting the test
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2020-06-24 15:50:51 +02:00 |
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