OVMS3-idf/components/nvs_flash/test
Ivan Grokhotkov 413f2c00f6 nvs_flash: introduce write failures after each word written
Previously the test bench would check failure recovery by introducing error after each write operation.
This makes checks a bit more extensive (and much longer) by failing after every word written. Surprisingly, this change didn't expose any bugs.
2016-10-31 19:17:25 +08:00
..
catch.hpp Initial public version 2016-08-17 23:08:22 +08:00
crc.cpp nvs_flash: use CRC-32 routine compatible with ROM version 2016-10-31 19:11:40 +08:00
crc.h Initial public version 2016-08-17 23:08:22 +08:00
main.cpp Initial public version 2016-08-17 23:08:22 +08:00
Makefile components/nvs: maintain item hash list at page level 2016-09-21 18:02:52 +08:00
sdkconfig.h components/nvs: fix build, use log library instead of printf 2016-09-23 09:00:28 +08:00
spi_flash_emulation.cpp spi_flash: change pointer type to void* 2016-10-27 17:58:42 +08:00
spi_flash_emulation.h nvs_flash: introduce write failures after each word written 2016-10-31 19:17:25 +08:00
test_compressed_enum_table.cpp Initial public version 2016-08-17 23:08:22 +08:00
test_intrusive_list.cpp components/nvs: strlcpy is not available on Linux, replace with strncpy and terminate strings explicitly 2016-08-23 15:14:13 +08:00
test_nvs.cpp nvs_flash: introduce write failures after each word written 2016-10-31 19:17:25 +08:00
test_spi_flash_emulation.cpp spi_flash: change pointer type to void* 2016-10-27 17:58:42 +08:00