Michael (XIAO Xufeng) 337b1df430 esp_flash: add unit test for external flash and QE toggling ... Tests for external flash chips used to controlled by macros, one bin for one chip. And tests are done manually. This commit refactored the test so that all 3 chips can all run in single test.		2019-11-21 12:26:15 +08:00
..
assign-test.yml	CI: use include to split large CI config file	2019-07-03 16:59:50 +08:00
build.yml	tools: update Windows installer build script	2019-10-18 11:10:41 +02:00
check.yml	Handle deprecated values in sdkconfig.defaults	2019-10-03 10:13:42 +02:00
deploy.yml	CI: use include to split large CI config file	2019-07-03 16:59:50 +08:00
host-test.yml	Fix error code collision and CI check	2019-09-03 08:07:16 +02:00
target-test.yml	esp_flash: add unit test for external flash and QE toggling	2019-11-21 12:26:15 +08:00