modify touch pad read function
The touch pad read function taks too much time within spin lock waiting for the "done bit". (about 7.6ms as we tested)
So we try to use a mutex on the touch read function and any other functions might change the "done bit".
See merge request !543
bugfix: i2c driver not working in 'RELEASE' configuration
This issue is reported from https://github.com/espressif/esp-idf/issues/304.
We found that when we operate the hw command registers in I2C struct, sometimes the behaviour would be different in DEBUG/RELEASE optimisation level:
The code looks like this:
```
I2C[i2c_num]->command[p_i2c->cmd_idx].byte_num -= 0;
```
In DEBUG configuration:
```
I2C[i2c_num]->command[p_i2c->cmd_idx].byte_num -= 0;
400f3ab0: 3388 l32i.n a8, a3, 12
400f3ab2: 14c882 addi a8, a8, 20
400f3ab5: a08840 addx4 a8, a8, a4
400f3ab8: 0020c0 memw
400f3abb: 2898 l32i.n a9, a8, 8
400f3abd: 0020c0 memw
400f3ac0: 28b8 l32i.n a11, a8, 8
400f3ac2: 74a090 extui a10, a9, 0, 8
400f3ac5: 00af92 movi a9, 0xffffff00
400f3ac8: 109b90 and a9, a11, a9
400f3acb: 2099a0 or a9, a9, a10
400f3ace: 0020c0 memw
400f3ad1: 2899 s32i.n a9, a8, 8
```
In RELEASE configuration:
```
I2C[i2c_num]->command[p_i2c->cmd_idx].byte_num -= 0;
400f2ba2: 580572 l8ui a7, a5, 88
400f2ba5: 747070 extui a7, a7, 0, 8
400f2ba8: 0020c0 memw
400f2bab: 584572 s8i a7, a5, 88
```
Looks like the compiler will make it a 8bit operation after optimisation.
But the register value changes from 0x901 to 0x101.
After this 8-bit optimisation, the 11th bit changed from 1 to zero, which caused this error.
We are still trying to find out why that happens, because there might be some risk when operating the register struct.
This is a workaround to avoid "-=" operation on I2C register struct fields.
See merge request !592
This issue is reported from https://github.com/espressif/esp-idf/issues/304.
We found that when we operate the hw command registers in I2C struct, sometimes the behaviour would be different in DEBUG/RELEASE optimisation level:
The code looks like this:
I2C[i2c_num]->command[p_i2c->cmd_idx].byte_num -= 0;
In DEBUG configuration:
I2C[i2c_num]->command[p_i2c->cmd_idx].byte_num -= 0;
400f3ab0: 3388 l32i.n a8, a3, 12
400f3ab2: 14c882 addi a8, a8, 20
400f3ab5: a08840 addx4 a8, a8, a4
400f3ab8: 0020c0 memw
400f3abb: 2898 l32i.n a9, a8, 8
400f3abd: 0020c0 memw
400f3ac0: 28b8 l32i.n a11, a8, 8
400f3ac2: 74a090 extui a10, a9, 0, 8
400f3ac5: 00af92 movi a9, 0xffffff00
400f3ac8: 109b90 and a9, a11, a9
400f3acb: 2099a0 or a9, a9, a10
400f3ace: 0020c0 memw
400f3ad1: 2899 s32i.n a9, a8, 8
In RELEASE configuration:
I2C[i2c_num]->command[p_i2c->cmd_idx].byte_num -= 0;
400f2ba2: 580572 l8ui a7, a5, 88
400f2ba5: 747070 extui a7, a7, 0, 8
400f2ba8: 0020c0 memw
400f2bab: 584572 s8i a7, a5, 88
Looks like the compiler will make it a 8bit operation after optimisation.
But the register value changes from 0x901 to 0x101.
After this 8-bit optimisation, the 11th bit changed from 1 to zero, which caused this error.
We are still trying to find out why that happens, because there might be some risk when operating the register struct.
This is a workaround to avoid "-=" operation on I2C register struct fields.
1. Add low speed channels for LEDC module.
2. Improve fade object allocate mechanism.
3. Improve ledc example, add 2 low speed channels in example.
4. Remove debug code
5. Improve the register bit field name of slow clock.
esp32: update wifi lib for some bugfix/features
1. add options to disable nvs
2. add station keepalive with softap
3. fix beacon rx start time not accurate issue
4. set wifi rx desc/buffer boundary check to internal memory boundary
See merge request !578
nvs_flash_init may return an error code in some cases, and applications
should check this error code (or at least assert on it being ESP_OK, to
make potential issues more immediately obvious).
This change modifies all the examples which use NVS to check the error
code. Most examples get a simple ESP_ERROR_CHECK assert, while NVS
examples, OTA example, and NVS unit tests get a more verbose check which
may be used in real applications.
Expand 'make monitor' support
New 'make monitor' idf_monitor tool for better monitor output. Running 'make monitor' will now:
* Automatically look up code addresses via addr2line and print function, source file, line number in terminal.
* Can reset the ESP32 by typing Ctrl-T Ctrl-R.
* Can run "make flash" by typing Ctrl-T Ctrl-F.
* Can run "make app-flash" by typing Ctrl-T Ctrl-A.
* If gdb stub starts, monitor will automatically run gdb and connect. When gdb exits, ESP32 resets and monitor resumes.
* Exit is still Ctrl-[
Have some more features I'd like to add (log output to file, crash dump support) but I think this is at the point of being useful.
See merge request !565
This change adds a check for the free page count to nvs_flash_init.
Under normal operation, NVS keeps at least one free page available,
except for transient states such as freeing up new page. Due to external
factors (such as NVS partition size reduction) this free page could be
lost, making NVS operation impossible. Previously this would cause an
error when performing any nvs_set operation or opening a new namespace.
With this change, an error is returned from nvs_flash_init to indicate
that NVS partition is in such a state.
Bugfix/mdns security issues
Fixes a series of security issues with MDNS.
STACK-SMASH: dd3f18d2d8/components/mdns/mdns.c (L494):
The sprintf is not limited. We can execute the sprintf codeflow as
many times as we want, allowing arbitrary long data being written
into stack.
PACKET-OF-DEATH:
dd3f18d2d8/components/mdns/mdns.c (L502).
The compare allows equal, and thus jumping back to it self infinite
recursion -> guaranteed crash
TXT-SMASH: dd3f18d2d8/components/mdns/mdns.c (L1381)
The loop does not check on reaching a->txt maximum size (1024),
resulting in stack overflow.
See merge request !576
make: don’t override TEST_COMPONENTS
When idf_monitor is launched from make, it gets modified `TEST_COMPONENTS`
variable which contains full paths to the test components instead of the
names. This causes `TEST_COMPONENT_PATHS` to be empty and the unit test
app gets built without any test components.
This change introduces an internal `TEST_COMPONENTS_LIST` variable which
gets set either from `COMPONENTS` if `TESTS_ALL` is 1, or from
`TEST_COMOPONENTS` otherwise.
Bootloader makefile is also fixed to avoid propagating `TESTS_ALL` to the
bootloader build step.
See merge request !569
bug fix: fix uart data bug when stop-bit is set as 2-bit mode
This is a workaround for a hardware bug.
When we want to use 2-stop-bit mode, we need to set stop-bit-1 and set dl1_en in rs485 register.
See merge request !544
1. add options to disable nvs
2. add station keepalive with softap
3. fix beacon rx start time not accurate issue
4. set wifi rx desc/buffer boundary check to internal memory boundary
Fix unit test app to print tests in the same order they are given in test file
This fixes the unit test app to print test cases in the same order they are given in test file.
See merge request !460
