1. Fix the WiFi/BT coexist bug
2. Fix WPA2 enterprise example crash bug
3. Add size and version check for crypto type struct
4. Add MD5 check for crypto type header file
1. add mesh_assoc_t to esp_mesh_internal.h file.
2. rename "node" to "device" in esp_mesh.h.
3. add MESH_EVENT_SCAN_DONE event.
4. add APIs esp_mesh_scan_get_ap_record() and esp_mesh_scan_get_ap_ie_len() to get scan results.
5. modify API esp_mesh_set_self_organized() by adding parameter "select_parent".
6. modify API esp_mesh_set_parent() by adding parameter "parent_mesh_id"
7. add manual networking example.
1. Store the calibration data to NVS if PHY does full calibration because of calibration data checksum failure
2. Pass the station's mac to PHY for checksum calculation
A new method of workaround an error with DPORT is to ensure that the APB is read and followed by the DPORT register without interruptions and pauses. This fix places this implementation in the IRAM to exclude errors associated with the cache miss.
Added .rtc_noinit and .noinit section definitions into linker file /esp32/ld/esp32.common.ld.
The macro __NOINIT_ATTR, RTC_NOINIT_ATTR declared in esp32/esp_attr.h file.
Added unit test file to test added behavior for noinit variables and its attributes.
Added documentation changes for new added attributes.
Make some corrections after code review:
The linker file has been corrected to place noinit section before bss_start to make it safer.
Documentation file has been modified to clarify reset behavior of allocated data .
Corrected typos in test_noinit.c and removed assertion of noinit variable to avoid possible issues with ROM boot loader memory allocation.
The linker file has been corrected to place noinit section before bss_start to make it safer.
Documentation file has been modified to clarify reset behavior of allocated data .
Corrected typos in test_noinit.c and removed assertion of noinit variable to avoid possible issues with ROM boot loader memory allocation.
Update test_noinit.c file to address RTCWDT_RTC_RESET reset reason instead of POWERON_RESET.
Test optimized to pass automated unit testing.
esp32: Add .noinit and .rtc_noinit sections to the linker script
Update of general-notes.rst documentation to fomat examples as code and attributes as identifiers.
Test test_noinit.c corrected to pass automated testing (support ofTEST_CASE_MULTIPLE_STAGES())
https://ezredmine.espressif.cn:8765/issues/15878
When two CPUs read the area of the DPORT and the area of the APB, the result is corrupted for the CPU that read the APB area.
And another CPU has valid data.
The method of eliminating this error.
Before reading the registers of the DPORT, make a preliminary reading of the APB register.
In this case, the joint access of the two CPUs to the registers of the APB and the DPORT is successful.
1. Bootloader reads SPI configuration from bin header, so that the burning configuration can be different with compiling configuration.
2. Psram mode init will overwrite original flash speed mode, so that users can change psram and flash speed after OTA. 3. Flash read mode(QIO/DIO…) will not be changed in app bin. It is decided by bootloader, OTA can not change this mode.
4. Add read flash ID function, and save flash ID in g_rom_flashchip
5. Set drive ability for all related GPIOs
6. Check raise VDDSDIO voltage in 80Mhz mode
7. Add check flash ID and update settings in bootloader
8. Read flash ID once and keep in global variable
9. Read flash image header once and reuse the result
Tested cases:
1. Test new and old version of bootloader
boot Flash 20M —> app Flash 80M + Psram 80M
boot Flash 40M —> app Flash 80M + Psram 80M
boot Flash 80M —> app Flash 80M + Psram 80M
boot Flash 20M —> app Flash 80M + Psram 40M
boot Flash 40M —> app Flash 80M + Psram 40M
boot Flash 80M —> app Flash 80M + Psram 40M
boot Flash 20M —> app Flash 40M + Psram 40M
boot Flash 40M —> app Flash 40M + Psram 40M
boot Flash 80M —> app Flash 40M + Psram 40M 2. Working after esp_restart reboot.
