Writing values longer than half of the page size (with header taken into
account) causes fragmentation issues. Previously it was suggested on the
forum that using long values may cause issues, but this wasn’t checked
in the library itself, and wasn’t documented. This change adds necessary
checks and introduces the new error code.
Documentation is also fixed to reflect the fact that the maximum length
of the key is 15 characters, not 16.
Since read cache was introduced at page level, search cache became
useless in terms of reducing the number of flash read operations.
In addition to that, search cache used an assumption that if pointers to
keys are identical, the keys are also identical, which was proven wrong
by applications which generate key names dynamically.
This change removes CachedFindInfo, and all its uses. This is done at
expense of a small extra number of CPU operations (looking up a value in
the read cache is slightly more expensive) but no extra flash read
operations.
Ref TW12505
Ref https://github.com/espressif/arduino-esp32/issues/365
Introduces new internal function, Page::alterEntryRangeState, which gathers changes to multiple elements of entry state table into a single write, provided that these changes fall into a single word. This allows changing state of up to 16 entries in a single write.
Also adds new function, writeEntryData, which writes the whole payload of SZ and BLOB type entries in one go, instead of splitting it into multiple 32-byte writes.
This reduces number of writes required for SZ and BLOB entries.
This commit fixes several issues with state handling in nvs::Page. It also adds extra consistency checks in nvs::PageManger initialization.
These changes were verified with a new long-running test ("test recovery from sudden poweroff"). This test works by repeatedly performing same pseudorandom sequence of calls to nvs_ APIs. Each time it repeats the sequence, it introduces a failure into one of flash operations (write or erase). So if one iteration of this test needs, say, 25000 flash operations, then this test will run 25000 iterations, each time introducing the failure point at different location.
