Previously the test bench would check failure recovery by introducing error after each write operation.
This makes checks a bit more extensive (and much longer) by failing after every word written. Surprisingly, this change didn't expose any bugs.
spi_flash_read and spi_flash_write currently have a limitation that source and destination must be word-aligned.
This can be fixed by adding code paths for various unaligned scenarios, but function signatures also need to be adjusted.
As a first step (since we are pre-1.0 and can still change function signatures) alignment checks are added, and pointer types are relaxed to uint8_t.
Later we will add handling of unaligned operations.
This change also introduces spi_flash_erase_range and spi_flash_get_chip_size functions.
We probably need something like spi_flash_chip_size_detect which will detect actual chip size.
This is to allow single application binary to be used on a variety of boards and modules.
This commit fixes several issues with state handling in nvs::Page. It also adds extra consistency checks in nvs::PageManger initialization.
These changes were verified with a new long-running test ("test recovery from sudden poweroff"). This test works by repeatedly performing same pseudorandom sequence of calls to nvs_ APIs. Each time it repeats the sequence, it introduces a failure into one of flash operations (write or erase). So if one iteration of this test needs, say, 25000 flash operations, then this test will run 25000 iterations, each time introducing the failure point at different location.
