check master read write functions with array of registers)
fix master serial processing code and modbus controller to work with register array
modbus_master: add reading and writing of test value array (58 registers) to check failure is gone
remove parameter temporary buffer from modbus controller to allow more than 24 byte writes
driver: fix issue with TOUT feature
driver: fix uart_rx_timeout issue
driver: fix issue with rxfifo_tout_int_raw not triggered when received fifo_len = 120 byte and all bytes read out of fifo as result of rxfifo_full_int_raw
driver: add function uart_internal_set_always_rx_timeout() to always handle tout interrupt
examples: call uart_internal_set_always_rx_timeout() to handle tout interrupt correctly
examples: update examples to use tout feature
driver: reflect changes of uart_set_always_rx_timeout() function, change uart.c
driver: change conditions to trigger workaround for tout feature in uart.c
driver: change uart_set_always_rx_timeout()
freemodbus: fix tabs, remove commented code
driver: remove uart_ll_is_rx_idle()
* Add test support for ESP32S2
* Add loop back test
* Support chip internal connection, no external wiring required.
* Delete the relevant codes of PDM of ESP32-S2 ll layer.
* fix dac dma mode issue
* Let `[ignore] case` return to freedom
1) Because this test uses its own ISR, we need to release it with `esp_intr_free` instead of `pcnt_isr_service_uninstall`.
2) `pcnt_evt_queue` needs to be created before the interrupt is registered and needs to be released at the end of each case.
* Add test support for ESP32S2
* Support chip internal connection, no external wiring required.
The following commit refactors the CAN driver such that
it is split into HAL and Lowlevel layers. The following
changes have also been made:
- Added bit field members to can_message_t as alternative
to message flags. Updated examples and docs accordingly
- Register field names and fields of can_dev_t updated
* Modify the function implementation of ESP32-S2 RTC GPIO
On ESP32 those PADs which have RTC functions must set pullup/down/capability via RTC register.
On ESP32-S2, Digital IOs have their own registers to control pullup/down/capability, independent with RTC registers.
* Add ESP32-S2 support of unit test
* Modify the pull-up test of unit test
* Modify the interrupt test of unit test
* Modify input and output mode test of unit test
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
