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esp_flash: add unit test for external flash and QE toggling

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Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
This commit is contained in:
Michael (XIAO Xufeng) 2019-09-04 21:09:30 +08:00
parent 41e64bd79c
commit 337b1df430
2 changed files with 222 additions and 152 deletions
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359
components/spi_flash/test/test_esp_flash.c
View file

@ -17,19 +17,18 @@
#include "driver/spi_common.h"
#include "driver/gpio.h"
#include "soc/io_mux_reg.h"
#include "sdkconfig.h"
#define FUNC_SPI 1
static uint8_t sector_buf[4096];
// #define TEST_SPI1_CS1
// #define TEST_SPI2_CS0
// #define TEST_SPI3_CS0
#define TEST_SPI_SPEED ESP_FLASH_10MHZ
#define TEST_SPI_READ_MODE SPI_FLASH_FASTRD
//#define FORCE_GPIO_MATRIX
#define EXTRA_SPI1_CLK_IO 17 //the pin which is usually used by the PSRAM clk
#define HSPI_PIN_NUM_MOSI HSPI_IOMUX_PIN_NUM_MOSI
#define HSPI_PIN_NUM_MISO HSPI_IOMUX_PIN_NUM_MISO
#define HSPI_PIN_NUM_CLK HSPI_IOMUX_PIN_NUM_CLK
@ -42,40 +41,56 @@ static uint8_t sector_buf[4096];
#define VSPI_PIN_NUM_HD VSPI_IOMUX_PIN_NUM_HD
#define VSPI_PIN_NUM_WP VSPI_IOMUX_PIN_NUM_WP
#if defined TEST_SPI1_CS1
# define TEST_HOST SPI_HOST
# define TEST_CS 1
// #define TEST_CS_PIN 14
# define TEST_CS_PIN 16 //the pin which is usually used by the PSRAM
// #define TEST_CS_PIN 27
# define TEST_INPUT_DELAY 0
# define EXTRA_SPI1_CLK_IO 17 //the pin which is usually used by the PSRAM clk
#elif defined TEST_SPI2_CS0
# define TEST_HOST HSPI_HOST
# define TEST_CS 0
# define TEST_CS_PIN HSPI_IOMUX_PIN_NUM_CS
# define TEST_INPUT_DELAY 20
#elif defined TEST_SPI3_CS0
# define TEST_HOST VSPI_HOST
# define TEST_CS 0
# define TEST_CS_PIN VSPI_IOMUX_PIN_NUM_CS
# define TEST_INPUT_DELAY 0
#define ALL_TEST_NUM (sizeof(config_list)/sizeof(flashtest_config_t))
typedef void (*flash_test_func_t)(esp_flash_t* chip);
#define FLASH_TEST_CASE(STR, FUNC_TO_RUN) \
TEST_CASE(STR, "[esp_flash]") {flash_test_func(FUNC_TO_RUN, 1);}
#ifdef CONFIG_ESP32_SPIRAM_SUPPORT
// These tests needs external flash, right on the place of psram
#define FLASH_TEST_CASE_3(STR, FUNCT_TO_RUN)
#else
# define SKIP_EXTENDED_CHIP_TEST
#define FLASH_TEST_CASE_3(STR, FUNC_TO_RUN) \
TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH]") {flash_test_func(FUNC_TO_RUN, ALL_TEST_NUM);}
#endif
//currently all the configs are the same with esp_flash_spi_device_config_t, no more information required
typedef esp_flash_spi_device_config_t flashtest_config_t;
static const char TAG[] = "test_esp_flash";
#ifndef SKIP_EXTENDED_CHIP_TEST
static esp_flash_t *test_chip = NULL;
flashtest_config_t config_list[] = {
// 0 always reserved for main flash
{
.host_id = -1, // no need to init
},
{
.io_mode = TEST_SPI_READ_MODE,
.speed = TEST_SPI_SPEED,
.host_id = SPI_HOST,
.cs_id = 1,
.cs_io_num = 16, //the pin which is usually used by the PSRAM
.input_delay_ns = 0,
},
/* current runner doesn't have a flash on HSPI
{
.io_mode = TEST_SPI_READ_MODE,
.speed = TEST_SPI_SPEED,
.host = HSPI_HOST,
.cs_id = 0,
.cs_io_num = HSPI_IOMUX_PIN_NUM_CS,
.input_delay_ns = 20,
},
*/
{
.io_mode = TEST_SPI_READ_MODE,
.speed = TEST_SPI_SPEED,
.host_id = VSPI_HOST,
.cs_id = 0,
.cs_io_num = VSPI_IOMUX_PIN_NUM_CS,
.input_delay_ns = 0,
},
};
static void setup_bus(spi_host_device_t host_id)
{
@ -128,33 +143,50 @@ static void release_bus(int host_id)
}
}
static void setup_new_chip(esp_flash_io_mode_t io_mode, esp_flash_speed_t speed)
static void setup_new_chip(const flashtest_config_t* test_cfg, esp_flash_t** out_chip)
{
//the bus should be initialized before the flash is attached to the bus
setup_bus(TEST_HOST);
if (test_cfg->host_id == -1) {
*out_chip = NULL;
return;
}
setup_bus(test_cfg->host_id);
esp_flash_spi_device_config_t dev_cfg = {
.host_id = TEST_HOST,
.io_mode = io_mode,
.speed = speed,
.cs_id = TEST_CS,
.cs_io_num = TEST_CS_PIN,
.input_delay_ns = TEST_INPUT_DELAY,
.host_id = test_cfg->host_id,
.io_mode = test_cfg->io_mode,
.speed = test_cfg->speed,
.cs_id = test_cfg->cs_id,
.cs_io_num = test_cfg->cs_io_num,
.input_delay_ns = test_cfg->input_delay_ns,
};
esp_err_t err = spi_bus_add_flash_device(&test_chip, &dev_cfg);
esp_flash_t* init_chip;
esp_err_t err = spi_bus_add_flash_device(&init_chip, &dev_cfg);
TEST_ESP_OK(err);
err = esp_flash_init(test_chip);
err = esp_flash_init(init_chip);
TEST_ESP_OK(err);
*out_chip = init_chip;
}
void teardown_test_chip()
void teardown_test_chip(esp_flash_t* chip, spi_host_device_t host)
{
spi_bus_remove_flash_device(test_chip);
test_chip = NULL;
release_bus(TEST_HOST);
//happen to work when chip==NULL
spi_bus_remove_flash_device(chip);
release_bus(host);
}
#endif
static void flash_test_func(flash_test_func_t func, int test_num)
{
for (int i = 0; i < test_num; i++) {
flashtest_config_t* config = &config_list[i];
esp_flash_t* chip;
setup_new_chip(config, &chip);
(*func)(chip);
teardown_test_chip(chip, config->host_id);
}
}
/* ---------- Test code start ------------*/
static void test_metadata(esp_flash_t *chip)
{
@ -165,15 +197,8 @@ static void test_metadata(esp_flash_t *chip)
printf("Flash ID %08x detected size %d bytes\n", id, size);
}
TEST_CASE("SPI flash metadata functions", "[esp_flash]")
{
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_metadata(test_chip);
teardown_test_chip();
#endif
test_metadata(NULL);
}
FLASH_TEST_CASE("SPI flash metadata functions", test_metadata);
FLASH_TEST_CASE_3("SPI flash metadata functions", test_metadata);
static uint32_t erase_test_region(esp_flash_t *chip, int num_sectors)
{
@ -204,7 +229,7 @@ static uint32_t erase_test_region(esp_flash_t *chip, int num_sectors)
return offs;
}
void test_simple_read_write(void *chip)
void test_simple_read_write(esp_flash_t *chip)
{
ESP_LOGI(TAG, "Testing chip %p...", chip);
uint32_t offs = erase_test_region(chip, 1);
@ -231,17 +256,10 @@ void test_simple_read_write(void *chip)
}
}
TEST_CASE("SPI flash simple read/write", "[esp_flash]")
{
test_simple_read_write(NULL);
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_simple_read_write(test_chip);
teardown_test_chip();
#endif
}
FLASH_TEST_CASE("SPI flash simple read/write", test_simple_read_write);
FLASH_TEST_CASE_3("SPI flash simple read/write", test_simple_read_write);
void test_unaligned_read_write(void *chip)
void test_unaligned_read_write(esp_flash_t *chip)
{
ESP_LOGI(TAG, "Testing chip %p...", chip);
uint32_t offs = erase_test_region(chip, 2);
@ -259,17 +277,10 @@ void test_unaligned_read_write(void *chip)
TEST_ASSERT(memcmp(buf, msg, strlen(msg) + 1) == 0);
}
TEST_CASE("SPI flash unaligned read/write", "[esp_flash]")
{
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_unaligned_read_write(test_chip);
teardown_test_chip();
#endif
test_unaligned_read_write(NULL);
}
FLASH_TEST_CASE("SPI flash unaligned read/write", test_unaligned_read_write);
FLASH_TEST_CASE_3("SPI flash unaligned read/write", test_unaligned_read_write);
void test_single_read_write(void *chip)
void test_single_read_write(esp_flash_t* chip)
{
ESP_LOGI(TAG, "Testing chip %p...", chip);
uint32_t offs = erase_test_region(chip, 2);
@ -285,21 +296,14 @@ void test_single_read_write(void *chip)
}
}
TEST_CASE("SPI flash single byte reads/writes", "[esp_flash]")
{
test_single_read_write(NULL);
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_single_read_write(test_chip);
teardown_test_chip();
#endif
}
FLASH_TEST_CASE("SPI flash single byte reads/writes", test_single_read_write);
FLASH_TEST_CASE_3("SPI flash single byte reads/writes", test_single_read_write);
/* this test is notable because it generates a lot of unaligned reads/writes,
and also reads/writes across both a sector boundary & many page boundaries.
*/
void test_three_byte_read_write(void *chip)
void test_three_byte_read_write(esp_flash_t *chip)
{
ESP_LOGI(TAG, "Testing chip %p...", chip);
uint32_t offs = erase_test_region(chip, 2);
@ -316,15 +320,8 @@ void test_three_byte_read_write(void *chip)
}
}
TEST_CASE("SPI flash three byte reads/writes", "[esp_flash]")
{
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_three_byte_read_write(test_chip);
teardown_test_chip();
#endif
test_three_byte_read_write(NULL);
}
FLASH_TEST_CASE("SPI flash three byte reads/writes", test_three_byte_read_write);
FLASH_TEST_CASE_3("SPI flash three byte reads/writes", test_three_byte_read_write);
void test_erase_large_region(esp_flash_t *chip)
{
@ -356,15 +353,8 @@ void test_erase_large_region(esp_flash_t *chip)
TEST_ASSERT_EQUAL_HEX32(0xFFFFFFFF, readback);
}
TEST_CASE("SPI flash erase large region", "[esp_flash]")
{
test_erase_large_region(NULL);
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_erase_large_region(test_chip);
teardown_test_chip();
#endif
}
FLASH_TEST_CASE("SPI flash erase large region", test_erase_large_region);
FLASH_TEST_CASE_3("SPI flash erase large region", test_erase_large_region);
static void test_write_protection(esp_flash_t* chip)
{
@ -386,15 +376,8 @@ static void test_write_protection(esp_flash_t* chip)
}
}
TEST_CASE("Test esp_flash can enable/disable write protetion", "[esp_flash]")
{
test_write_protection(NULL);
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_write_protection(test_chip);
teardown_test_chip();
#endif
}
FLASH_TEST_CASE("Test esp_flash can enable/disable write protetion", test_write_protection);
FLASH_TEST_CASE_3("Test esp_flash can enable/disable write protetion", test_write_protection);
static const uint8_t large_const_buffer[16400] = {
203, // first byte
@ -411,8 +394,73 @@ static void test_write_large_buffer(esp_flash_t *chip, const uint8_t *source, si
static void write_large_buffer(esp_flash_t *chip, const esp_partition_t *part, const uint8_t *source, size_t length);
static void read_and_check(esp_flash_t *chip, const esp_partition_t *part, const uint8_t *source, size_t length);
TEST_CASE("SPI flash test reading with all speed/mode permutations", "[esp_flash]")
// Internal functions for testing, from esp_flash_api.c
esp_err_t esp_flash_set_io_mode(esp_flash_t* chip, bool qe);
esp_err_t esp_flash_get_io_mode(esp_flash_t* chip, bool* qe);
esp_err_t esp_flash_read_chip_id(esp_flash_t* chip, uint32_t* flash_id);
static bool check_winbond_chip(esp_flash_t* chip)
{
uint32_t flash_id;
esp_err_t ret = esp_flash_read_chip_id(chip, &flash_id);
TEST_ESP_OK(ret);
if ((flash_id >> 16) == 0xEF) {
return true;
} else {
return false;
}
}
static void test_toggle_qe(esp_flash_t* chip)
{
bool qe;
if (chip == NULL) {
chip = esp_flash_default_chip;
}
esp_flash_io_mode_t io_mode_before = chip->read_mode;
esp_err_t ret = esp_flash_get_io_mode(chip, &qe);
TEST_ESP_OK(ret);
bool is_winbond_chip = check_winbond_chip(chip);
for (int i = 0; i < 4; i ++) {
ESP_LOGI(TAG, "write qe: %d->%d", qe, !qe);
qe = !qe;
chip->read_mode = qe? SPI_FLASH_QOUT: SPI_FLASH_SLOWRD;
ret = esp_flash_set_io_mode(chip, qe);
if (is_winbond_chip && !qe && ret == ESP_ERR_FLASH_NO_RESPONSE) {
//allows clear qe failure for Winbond chips
ret = ESP_OK;
}
TEST_ESP_OK(ret);
bool qe_read;
ret = esp_flash_get_io_mode(chip, &qe_read);
TEST_ESP_OK(ret);
ESP_LOGD(TAG, "qe read: %d", qe_read);
if (qe != qe_read && !qe && is_winbond_chip) {
ESP_LOGE(TAG, "cannot clear QE bit, this may be normal for Winbond chips.");
chip->read_mode = io_mode_before;
return;
}
TEST_ASSERT_EQUAL(qe, qe_read);
}
//restore the io_mode after test
chip->read_mode = io_mode_before;
}
FLASH_TEST_CASE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
FLASH_TEST_CASE_3("Test esp_flash_write can toggle QE bit", test_toggle_qe);
void test_permutations(flashtest_config_t* config)
{
//replace config pointer with pointer to internal temporary config
flashtest_config_t temp_cfg;
memcpy(&temp_cfg, config, sizeof(flashtest_config_t));
flashtest_config_t* cfg = &temp_cfg;
esp_flash_t* chip;
const int length = sizeof(large_const_buffer);
uint8_t *source_buf = malloc(length);
TEST_ASSERT_NOT_NULL(source_buf);
@ -424,60 +472,75 @@ TEST_CASE("SPI flash test reading with all speed/mode permutations", "[esp_flash
const esp_partition_t *part = get_test_data_partition();
TEST_ASSERT(part->size > length + 2 + SPI_FLASH_SEC_SIZE);
#ifndef SKIP_EXTENDED_CHIP_TEST
//use the lowest speed to write and read to make sure success
setup_new_chip(TEST_SPI_READ_MODE, ESP_FLASH_SPEED_MIN);
write_large_buffer(test_chip, part, source_buf, length);
read_and_check(test_chip, part, source_buf, length);
teardown_test_chip();
//write data to be read, and use the lowest speed to write and read to make sure success
cfg->io_mode = SPI_FLASH_READ_MODE_MIN;
cfg->speed = ESP_FLASH_SPEED_MIN;
setup_new_chip(cfg, &chip);
write_large_buffer(chip, part, source_buf, length);
read_and_check(chip, part, source_buf, length);
teardown_test_chip(chip, cfg->host_id);
esp_flash_read_mode_t io_mode = SPI_FLASH_READ_MODE_MIN;
while (io_mode != SPI_FLASH_READ_MODE_MAX) {
if (config->host_id != -1) {
esp_flash_speed_t speed = ESP_FLASH_SPEED_MIN;
while (speed != ESP_FLASH_SPEED_MAX) {
ESP_LOGI(TAG, "test flash io mode: %d, speed: %d", io_mode, speed);
setup_new_chip(io_mode, speed);
read_and_check(test_chip, part, source_buf, length);
teardown_test_chip();
//test io_mode in the inner loop to test QE set/clear function, since
//the io mode will switch frequently.
esp_flash_io_mode_t io_mode = SPI_FLASH_READ_MODE_MIN;
while (io_mode != SPI_FLASH_READ_MODE_MAX) {
ESP_LOGI(TAG, "test flash io mode: %d, speed: %d", io_mode, speed);
cfg->io_mode = io_mode;
cfg->speed = speed;
setup_new_chip(cfg, &chip);
read_and_check(chip, part, source_buf, length);
teardown_test_chip(chip, cfg->host_id);
io_mode++;
}
speed++;
}
io_mode++;
} else {
//test main flash
write_large_buffer(NULL, part, source_buf, length);
read_and_check(NULL, part, source_buf, length);
}
#endif
//test main flash BTW
write_large_buffer(NULL, part, source_buf, length);
read_and_check(NULL, part, source_buf, length);
free(source_buf);
}
TEST_CASE("Test esp_flash_write large const buffer", "[esp_flash]")
TEST_CASE("SPI flash test reading with all speed/mode permutations", "[esp_flash]")
{
//buffer in flash
test_write_large_buffer(NULL, large_const_buffer, sizeof(large_const_buffer));
#ifndef SKIP_EXTENDED_CHIP_TEST
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_write_large_buffer(test_chip, large_const_buffer, sizeof(large_const_buffer));
teardown_test_chip();
#endif
test_permutations(&config_list[0]);
}
#ifndef SKIP_EXTENDED_CHIP_TEST
TEST_CASE("Test esp_flash_write large RAM buffer", "[esp_flash]")
#ifndef CONFIG_ESP32_SPIRAM_SUPPORT
TEST_CASE("SPI flash test reading with all speed/mode permutations, 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH]")
{
for (int i = 0; i < ALL_TEST_NUM; i++) {
test_permutations(&config_list[i]);
}
}
#endif
static void test_write_large_const_buffer(esp_flash_t* chip)
{
test_write_large_buffer(chip, large_const_buffer, sizeof(large_const_buffer));
}
FLASH_TEST_CASE("Test esp_flash_write large const buffer", test_write_large_const_buffer);
FLASH_TEST_CASE_3("Test esp_flash_write large const buffer", test_write_large_const_buffer);
static void test_write_large_ram_buffer(esp_flash_t* chip)
{
// buffer in RAM
uint8_t *source_buf = malloc(sizeof(large_const_buffer));
TEST_ASSERT_NOT_NULL(source_buf);
memcpy(source_buf, large_const_buffer, sizeof(large_const_buffer));
setup_new_chip(TEST_SPI_READ_MODE, TEST_SPI_SPEED);
test_write_large_buffer(test_chip, source_buf, sizeof(large_const_buffer));
teardown_test_chip();
test_write_large_buffer(chip, source_buf, sizeof(large_const_buffer));
free(source_buf);
}
#endif
FLASH_TEST_CASE("Test esp_flash_write large RAM buffer", test_write_large_ram_buffer);
FLASH_TEST_CASE_3("Test esp_flash_write large RAM buffer", test_write_large_ram_buffer);
static void write_large_buffer(esp_flash_t *chip, const esp_partition_t *part, const uint8_t *source, size_t length)
{

15
tools/ci/config/target-test.yml
View file

@ -445,6 +445,13 @@ UT_033:
- psram
UT_034:
extends: .unit_test_template
parallel: 4
tags:
- ESP32_IDF
- UT_T1_ESP_FLASH
UT_035:
extends: .unit_test_template
parallel: 2
tags:
@ -452,28 +459,28 @@ UT_034:
- UT_T1_PSRAMV0
- psram
UT_035:
UT_036:
extends: .unit_test_template
parallel: 3
tags:
- ESP32_IDF
- UT_T1_no32kXTAL
UT_036:
UT_037:
extends: .unit_test_template
tags:
- ESP32_IDF
- UT_T1_no32kXTAL
- psram
UT_037:
UT_038:
extends: .unit_test_template
parallel: 3
tags:
- ESP32_IDF
- UT_T1_32kXTAL
UT_038:
UT_039:
extends: .unit_test_template
tags:
- ESP32_IDF