ESP-IDF comes with a unit test app based on Unity - unit test framework. Unit tests are integrated in the ESP-IDF repository and are placed in ``test`` subdirectory of each component respectively.
The normal test cases will be executed on one DUT (Device Under Test). Components need to communicate with each other (like GPIO, SPI ...) can't be tested with normal test cases.
Multiple devices test cases support writing and running test with multiple DUTs.
TEST_CASE_MULTIPLE_DEVICES("gpio multiple devices test example", "[driver]", gpio_master_test, gpio_slave_test);
The macro ``TEST_CASE_MULTIPLE_DEVICES`` is used to declare multiple devices test cases.
First argument is test case name, second argument is test case description.
From the third argument, upto 5 test functions can be defined, each function will be the entry point of tests running on each DUT.
Running test cases from different DUTs could require synchronizing between DUTs. We provide ``unity_wait_for_signal`` and ``unity_send_signal`` to support synchronizing with UART.
As the secnario in the above example, slave should get GPIO level after master set level. DUT UART console will prompt and requires user interaction:
Once the signal is sent from DUT2, you need to press "Enter" on DUT1, then DUT1 unblocks from ``unity_wait_for_signal`` and starts to change GPIO level.
Signals can also be used to pass parameters between multiple devices. For example, DUT1 want to know the MAC address of DUT2, so it can connect to DUT2.
In this case, ``unity_wait_for_signal_param`` and ``unity_send_signal_param`` can be used:
DUT1 console::
Waiting for signal: [dut2 mac address]!
Please input parameter value from any board send this signal and press "Enter" key.
DUT2 console::
Send signal: [dut2 mac address][10:20:30:40:50:60]!
Once the signal is sent from DUT2, you need to input ``10:20:30:40:50:60`` on DUT1 and press "Enter". Then DUT1 will get the MAC address string of DUT2 and unblocks from ``unity_wait_for_signal_param``, start to connect to DUT2.
The normal test cases are expected to finish without reset (or only need to check if reset happens). Sometimes we want to run some specific test after certain kinds of reset.
For example, we want to test if reset reason is correct after wakeup from deep sleep. We need to create deep sleep reset first and then check the reset reason.
To support this, we can define multiple stages test case, to group a set of test functions together::
static void trigger_deepsleep(void)
{
esp_sleep_enable_timer_wakeup(2000);
esp_deep_sleep_start();
}
void check_deepsleep_reset_reason()
{
RESET_REASON reason = rtc_get_reset_reason(0);
TEST_ASSERT(reason == DEEPSLEEP_RESET);
}
TEST_CASE_MULTIPLE_STAGES("reset reason check for deepsleep", "[esp32]", trigger_deepsleep, check_deepsleep_reset_reason);
Multiple stages test cases present a group of test functions to users. It need user interactions (select case and select different stages) to run the case.
*`make TESTS_ALL=1 TEST_EXCLUDE_COMPONENTS='xxx'` - build unit test app with all unit tests, except for unit tests of some components. (For instance: `make TESTS_ALL=1 TEST_EXCLUDE_COMPONENTS='ulp mbedtls'` - build all unit tests exludes ulp and mbedtls components).
When the build finishes, it will print instructions for flashing the chip. You can simply run ``make flash`` to flash all build output.
You can also run ``make flash TESTS_ALL=1`` or ``make TEST_COMPONENTS='xxx'`` to build and flash. Everything needed will be rebuilt automatically before flashing.
Use menuconfig to set the serial port for flashing.
Running unit tests
------------------
After flashing reset the ESP32 and it will boot the unit test app.
